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Final Program


Analytical Sciences Symposia

Category: Featured Syposium

A04.P1 - Contributions of Analytical Electron Microscopy to Understanding Microstructural Evolution in Materials: James Bentley Memorial Symposium

(107) Advanced STEM Analysis of Anion Void Lattice and Defects Evolution in Electron Irradiated CaF

Tuesday, July 29, 2025
3:00 PM - 5:00 PM MT

    Presenting Author(s)

  • LZ

    Lingfeng Zhou (he/him/his)

    University of Michigan, Ann Arbor
    Department of Materials Sciences and Engineering, University of Michigan
    Ann Arbor, MI, United States

    • Co-Author(s)

  • LW

    Lumin Wang

    University of Michigan, Ann Arbor, United States