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Analytical Sciences Symposia

Category: Featured Syposium

A07.P2 - Advances in SEM Instrumentation, Application and Techniques

(377) New Integrated Software for Soft X-ray Emission Spectrometer in EPMA System

Thursday, July 31, 2025

10:00 AM - 12:00 PM MT

Presenting Author(s)

Naoki Nakamura, Ph.D (he/him/his)

JEOL Ltd
Akishima, Tokyo, Japan

Co-Author(s)

SK

Shingo Kinoshita

JEOL Ltd, United States
SK

Shogo Koshiya, Ph.D

JEOL Ltd
Akishima, Tokyo, United States
Masaru Takakura, Ph.D

JEOL Ltd
Akishima, Tokyo, United States
TM

Takanori Murano

JEOL Ltd
Akishima, Tokyo, United States
Kenichi Tsutsumi (he/him/his)

JEOL Ltd.
Akishima, Tokyo, Japan
Vern Robertson

EPMA / SA Product Manager
JEOL USA, Inc.
Peabody, Massachusetts, United States
PM

Peter McSwiggen, Ph.D

JEOL USA, Inc., United States