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Analytical Sciences Symposia

Category: Featured Syposium

A08.P1 - Next Generation Microanalysis Standards For EPMA and SEM-EDS Calibration

(390) Trace Element Analyses of Micron-Size Particles and Statistical Determination of Minimum Detection Limits

Thursday, July 31, 2025

10:00 AM - 12:00 PM MT

Presenting Author(s)

PM

Peter McSwiggen

EPMA Applications
McSwiggen & Associates / JEOL USA, Inc.
Peabody, MA, United States

Co-Author(s)

AR

Alexis Riche

Savannah River National Laboratory, United States
KH

Kayleigh Harvey

JEOL USA, Inc., United States
SB

Shelby Bowden

Savannah River National Laboratory, United States
RB

Rachel Bergin

Savannah River National Laboratory, United States
SS

Spencer Scott

Savannah River National Laboratory, United States
BF

Bryan Foley

Savannah River National Laboratory, United States
KS

Kyle Samperton

Savannah River National Laboratory, United States