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Analytical Sciences Symposia

Category: Featured Syposium

A03.P1 - When 4D-STEM Meets More Dimensions: Deepening Materials Insights with Efficient Experimental Design and Smart Computational Microscopy

(364) Deep Learning-embedded 4D-STEM CBED Approach for Mapping Polymorphic Phase Distribution of Doped Hafnia Thin Films

Thursday, July 31, 2025

10:00 AM - 12:00 PM MT

Presenting Author(s)

Young-Hoon Kim, Ph.D (he/him/his)

Oak Ridge National Laboratory
Oak Ridge, TN, United States
MJ

Min-Hyoung Jung, Ph.D

Sungkyunkwan University, Republic of Korea
HL

Hyangsook Lee, Ph.D

Samsung Advanced Institute of Technology (SAIT), Samsung Electronics, Republic of Korea
EL

Eunha Lee, Ph.D

Samsung Advanced Institute of Technology (SAIT), Samsung Electronics, Republic of Korea
YK

Young-Min Kim, Ph.D

Sungkyunkwan University
Suwon-si, Republic of Korea