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Final Program


Analytical Sciences Symposia

Category: Featured Syposium

A03.P1 - When 4D-STEM Meets More Dimensions: Deepening Materials Insights with Efficient Experimental Design and Smart Computational Microscopy

(362) Chromatic Aberration Considering for Optimum Bright Field Imaging using 4D STEM Data

Thursday, July 31, 2025
10:00 AM - 12:00 PM MT

    Presenting Author(s)

  • Nanami Yamamoto

    Institute of Engineering Innovation, The University of Tokyo
    Institute of Engineering Innovation, The University of Tokyo
    ichikawa-City, Chiba, Japan

    • Co-Author(s)

  • MN

    Mitsuru Nogami

    Institute of Engineering Innovation, The University of Tokyo, Japan

  • TS

    Takehito Seki, Ph.D

    Institute of Engineering Innovation, The University of Tokyo, United States

  • YI

    Yuichi Ikuhara, Ph.D

    Institute of Engineering Innovation, School of Engineering, The University of Tokyo, United States

  • Naoya Shibata, Ph.D

    Professor
    Institute of Engineering Innovation, School of Engineering, The University of Tokyo
    The University of Tokyo
    Tokyo, Japan