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Analytical Sciences Symposia

Category: Featured Syposium

A05.P1 - Latest Advances in Atom Probe Tomography

(119) Analysis of Commercial Semiconductor Devices with Atom Probe Tomography

Tuesday, July 29, 2025

3:00 PM - 5:00 PM MT

Presenting Author(s)

Robert M. Ulfig, MS

Sr. Business Developer
CAMECA Instruments Inc.
Madison, WI, United States

Co-Author(s)

Katherine P. Rice, Ph.D

Applications Lab Manager
CAMECA Instruments Inc.
Madison, Wisconsin, United States
Isabelle Y. Martin, MS

Sr Applications Scientist
CAMECA Instruments Inc.
Madison, Wisconsin, United States
YC

Yimeng Chen, Ph.D

Eurofins Nanolab Technology
Milpitas, California, United States