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Final Program


Analytical Sciences Symposia

Category: Featured Syposium

A06.P1 - Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens

(32) Which Instrument Should You Use for High Lateral Resolution Chemical Analysis - SEM/EDS or ToF-SIMS?

Monday, July 28, 2025
3:00 PM - 5:00 PM MT

    Presenting Author(s)

  • Vincent S. Smentkowski, Ph.D

    Senior Scientist - Microscopy and Microanalysis
    GE Vernova Advanced Research Center
    GE Vernova Advanced Research Center
    Niskayuna, NY, United States

    • Co-Author(s)

  • DG

    Deliang Guo

    GE Vernova Advanced Research Center, United States

  • FK

    Felix Kollmer (he/him/his)

    Senior R&D Scientist
    IONTOF Technologies GmbH
    Muenster, United States