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Final Program


Cross-Disciplinary Symposia

Category: Featured Syposium

C06.P1 - Advancements in Generative Artificial Intelligence and Automation for Electron Microscopy

(297) Deep Learning for Noise Reduction in High-Resolution In-Situ TEM

Wednesday, July 30, 2025
3:00 PM - 5:00 PM MT

    Presenting Author(s)

  • AP

    Agus Poerwoprajitno

    Sandia National Laboratories, United States

    • Co-Author(s)

  • YG

    Yash Gandhi

    University of Southern California, United States

  • CC

    C. Barry Carter, D.Phil., Sc.D.

    Professor
    UCONN Ret.
    (2) Center for Integrated Nanotechnologies, Sandia National Laboratories, Albuquerque, NM-87185, USA
    Coventry, Connecticut, United States

  • JW

    John Watt

    Scientist
    Los Alamos National Laboratory, Connecticut, United States

  • DH

    Dale L. Huber

    Sandia National Laboratories, United States

  • RK

    Rajiv Kalia

    University of Southern California, United States