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Final Program


Physical Sciences Symposia

Category: Featured Syposium

A07.P1 - Advances in SEM Instrumentation, Application and Techniques

(234) Quantitative X-ray Mapping of Ni Superalloys

Wednesday, July 30, 2025
3:00 PM - 5:00 PM MT

    Presenting Author(s)

  • ON

    Owen K. Neill, M.Sc., PhD

    Manager, R.B. Mitchell Electron Microbeam Analysis Lab
    University of Michigan
    Ann Arbor, MI, United States