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Analytical Sciences Symposia

Category: Featured Syposium

A02.P1 - Frontiers of Electron Ptychography

(9) Aberration Measurement by Electron Ptychography and Consistency Among Different Algorithms

Monday, July 28, 2025

3:00 PM - 5:00 PM MT

Presenting Author(s)

Tizian Lorenzen

Ludwig-Maximilians University Munich, United States

Co-Author(s)

BD

Benedikt Diederichs

Ludwig-Maximilians-University Munich, United States
CO

Charles Otieno Ogolla

University of Siegen, United States
BB

Benjamin Butz

University of Siegen, United States
KM

Knut Müller-Caspary

Ludwig-Maximilians University Munich, United States