Analytical Sciences Symposia

Deep Learning-Driven High-Throughput High-Resolution TEM Analysis of Surface Characteristics during Nanocrystal Growth

Presenting Author(s)

• MC

  Min Gee Cho

  National Center for Electron Microscopy, Lawrence Berkeley National Laboratory
  (1) Department of Materials Science and Engineering, University of California, Berkeley, United States

Co-Author(s)

• LR

  Luis Rangel DaCosta (he/him/his)

  PhD Student
  University of California, Berkeley, United States
• KS

  Katherine Sytwu

  Postdoc
  National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, United States
• MO

  Myounghwan Oh

  Korea Institute of Energy Technology, United States
• MS

  Mary Scott, Ph.D (she/her/hers)

  Assistant Professor
  Department of Materials Science and Engineering, University of California, Berkeley
  (1) Lawrence Berkeley National Laboratory
  Berkeley, California, United States