Analytical Sciences Symposia

Depth information from backscattered scanning electron microscope images using multiple beam energies and parameter estimation methods

Presenting Author(s)

• MR

  Martin Ritter (he/him/his)

  Head of Electron Microscopy
  Hamburg University of Technology
  Hamburg, Hamburg, Germany

Co-Author(s)

• TS

  Trushal Sardhara

  University Hospital RWTH Aachen
  Hamburg, Germany
• MH

  Matthias Hemmleb

  point electronic GmbH, Germany