A01.1 - Advances in Focused Ion Beam Instrumentation, Applications, and Techniques for Materials and Life Sciences

Sponsored By 

Session Chair(s)

• MT

  Matthew Thorseth, Ph.D. (he/him/his)

  Research Scientist
  Dow Chemical
  Midland, Michigan, United States
• DP

  Daniel Perea

  Scientist
  Pacific Northwest National Laboratory (PNNL)
  Pacific Northwest National Laboratory (PNNL)
  Richland, WA, United States
• 

  Jamie Ford, PhD

  Staff Scientist
  University of Pennsylvania
  University of Pennsylvania
  Philadelphia, PA, United States
• SY

  Shize Yang

Presentations:

• 1:30 PM - 2:00 PM MT

  From thin film to battery: FIB-SIMS with TOF technology for high resolution chemical imaging
  

  Presenting Author: Lex Pillatsch – TOFWERK

  Co-Author: James Whitby – TOFWERK

  Co-Author: Valentine Riedo-Grimaudo – TOFWERK
• 2:00 PM - 2:15 PM MT

  Advanced Characterization of Materials at the Nanoscale Using SIMS
  

  Presenting Author: Peter Gnauck – Raith Group

  Co-Author: Alexander Ost – Raith Group

  Co-Author: Torsten Richter – Raith Group
• 2:15 PM - 2:30 PM MT

  Automated FIB Cross-Sectioning for 3D SIMS: Local Volume and Global Volume 7Li+ Distribution in NMC811
  

  Presenting Author: chengge Jiao, Ph.D (he/him/his) – Thermo Fisher Scientific
• 2:30 PM - 2:45 PM MT

  Cancelled - Enhancing TEM Sample Preparation Efficiency with an Adjustable Nanomanipulator Tip for FIB-SEM Systems
  

  Presenting Author: Valerie P. Brogden – CAMCOR, University of Oregon

  Co-Author: Jeff Garman – University of Oregon

  Co-Author: Steve Wiemholt – University of Oregon
• 2:45 PM - 3:00 PM MT

  The effect of ion energy application on damage induced in (S)TEM samples and the area of their creation respectively to the sample surface using different ion species and techniques
  

  Presenting Author: Martin Sláma (he/him/his) – TESCAN Group

  Co-Author: Shibabrata Basak – Forschungszentrum Jülich

  Co-Author: Lucille A Giannuzzi, PhD (she/her/hers) – TESCAN USA

  Co-Author: Lara Ahrens – Forschungszentrum Jülich GmbH

  Co-Author: Rüdiger‑A. Eichel – Forschungszentrum Jülich