Analytical Sciences Symposia

Lift-out Technique for Ultra-thin Plan-view Lamella Preparation Using Focused Ion Beam

Presenting Author(s)

• MT

  Mengkun Tian (he/him/his)

  Georgia Institute of Technology
  Atlanta, Georgia, United States

Co-Author(s)

• Na

  Nashrah afroze (she/her/hers)

  Georgia Institute of Technology
  Atlanta, Georgia, United States
• JK

  Josh Kacher

  Georgia Institute of Technology
  Atlanta, Georgia, United States
• AK

  Asif Islam Khan

  Georgia Institute of Technology
  Atlanta, Georgia, United States