A04.1 - Contributions of Analytical Electron Microscopy to Understanding Microstructural Evolution in Materials: James Bentley Memorial Symposium

Sponsored By 

Session Chair(s)

• MB

  M. Grace Burke, PhD

  Laboratory Fellow
  Idaho National Laboratory
  University of Manchester
  Pittsburgh, PA, United States
• NZ

  Nestor Zaluzec
• NE

  Neal Evans, Ph.D.

  University of Tennessee, Knoxville
  Knoxville, Tennessee, United States
• 

  Paul Kotula, PhD

  Distinguished Member of Technical Staff
  Sandia National Laboratories
  Albuquerque, NM, United States

Presentations:

• 10:30 AM - 11:00 AM MT

  Chemical Analysis in the TEM: the Bentley Factor
  

  Presenting Author: C. Barry Carter, D.Phil., Sc.D. – UCONN Ret.
• 11:00 AM - 11:30 AM MT

  Remembering Jim Bentley and his influence on my career
  

  Presenting Author: Paul G. Kotula, PhD – Sandia National Laboratories
• 11:30 AM - 11:45 AM MT

  EFTEM Reimagined: Bridging Legacy Methods with Machine Learning for Advanced Materials Analysis
  

  Presenting Author: Jafar F. AlSharab, Ph.D. – Northwestern State University
• 11:45 AM - 12:00 PM MT

  Iron Enrichment at Grain Boundaries in SrTiO3: Does It Stay or Does It Go?
  

  Presenting Author: Klaus van Benthem – The University of Alabama

  Co-Author: William Hahn – University of California, Davis

  Co-Author: Bin Feng – University of Tokyo

  Co-Author: Naoya Shibata, Ph.D – Institute of Engineering Innovation, School of Engineering, The University of Tokyo

  Co-Author: Yuichi Ikuhara – University of Tokyo