Analytical Sciences Symposia

Large Area Real-Space Crystallography and Thickness Determination of Mesoscopic Semiconductor Membranes Using Zone Axis Patterns and Correlative SEM-S/TEM Modes

Presenting Author(s)

• VO

  Vladimir P. Oleshko, Ph.D (he/him/his)

  Materials Engineer
  NIST
  Gaithersburg, MD, United States

Co-Author(s)

• GH

  Glenn Holland, B.A. (he/him/his)

  NIST
  Gaithersburg, Maryland, United States
• DW

  Daron Westly, M. Eng. (he/him/his)

  NIST
  Gaithersburg, Maryland, United States
• JV

  John Villarrubia, Ph.D (he/him/his)

  NIST
  Gaithersburg, Maryland, United States