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Final Program


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Analytical Sciences Symposia

A04.5 - Contributions of Analytical Electron Microscopy to Understanding Microstructural Evolution in Materials: James Bentley Memorial Symposium

Live STEM Imaging of Electronic Device Performance Degradation under Beta Radiation

Wednesday, July 30, 2025
2:15 PM - 2:30 PM MT
Location: 151 ABC

All papers can be viewed in the published Meeting Proceedings on the MaM journal website.

    Presenting Author(s)

  • William Hubbard, PhD

    CEO
    NanoElectronic Imaging Inc.
    Riverside, California, United States

    • Co-Author(s)

  • BR

    B. C. C. Regan

    Professor
    UCLA
    (2) California NanoSystems Institute (CNSI), University of California, Los Angeles, California 90095, United States, United States