Analytical Sciences Symposia

Measuring strain in moirés from overlapping dark field reflections in 4D-STEM

Presenting Author(s)

• IC

  Isaac Craig

  University of California, Berkeley, United States

Co-Author(s)

• MV

  Madeline Van Winkle, PhD

  Graduate student
  National Renewable Energy Laboratory, United States
• CO

  Colin Ophus

  Stanford University, United States
• DB

  D. Kwabena Bediako

  University of California Berkeley, United States