Analytical Sciences Symposia

Analytical Electron Microscopy with Cathodoluminescence to Classify Structural Defects Impeding Charge Transport in Power Electronics

Presenting Author(s)

• 

  Wei-Chang (David) Yang, PhD

  Materials Research Engineer
  Materials Science and Engineering Division, National Institute of Standards and Technology, Gaithersburg, MD, United States
  Gaithersburg, MD, United States

Co-Author(s)

• MK

  Min-Yeong Kim

  Nanoscale Device and Characterization Division, National Institute of Standards and Technology, Gaithersburg, MD, United States, United States
• AW

  Andrew Winchester

  Nanoscale Device and Characterization Division, National Institute of Standards and Technology, Gaithersburg, MD, United States, United States
• AM

  Alline Myers

  Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD, United States, United States
• SK

  Sang-Mo Koo

  Department of Electrical Material Engineering, Kwangwoon University, Seoul, Republic of Korea, United States
• QL

  Qiliang Li

  Department of Electrical Engineering, George Mason University, Fairfax, VA, United States, United States
• SP

  Sujitra Pookpanratana

  Nanoscale Device and Characterization Division, National Institute of Standards and Technology, Gaithersburg, MD, United States
  Gaithersburg, Maryland, United States