Cross-Disciplinary Symposia

Machine Learning Tool for Automated Analysis of Electron Microscopy Images

Presenting Author(s)

• 

  Carl Aune (he/him/his)

  Director of Business Development
  Epic Advanced Materials
  Thousand Oaks, CA, United States

Co-Author(s)

• SN

  Saber Naserifar

  Epic Advanced Materials
  Thousand Oaks, California, United States
• EG

  Evan Gurnick (he/him/his)

  Epic Advanced Materials
  Thousand Oaks, California, United States
• GJ

  Glenn Judd

  Epic Advanced Materials
  Thousand Oaks, California, United States