A02.5 - Frontiers of Electron Ptychography

Session Chair(s)

• CO

  Colum M. O'Leary (he/him/his)

  Research Associate
  SLAC National Accelerator Laboratory
  SLAC National Accelerator Laboratory , CA, United States
• 

  Yi Jiang

  Beamline Data Scientist
  Advanced Photon Source
  Argonne National Laboratory
  Lemont, Illinois, United States
• 

  Peng Wang, Ph.D

  Department of Physics, University of Warwick
  UNIVERSITY OF WARWICK
  Coventry, England, United States

Presentations:

• 8:30 AM - 9:00 AM MT

  3D Imaging of Defects, Buried Interfaces, and Strain with Multislice Electron Ptychography
  

  Presenting Author: Shake Karapetyan – Cornell University

  Co-Author: Steven E. Zeltmann – Platform for the Accelerated Realization, Analysis, and Discovery of Interface Materials (PARADIM)

  Co-Author: Prosun Santra – Helmholtz-Zentrum Dresden-Rossendorf

  Co-Author: Johannes Biskupek, Ph.D – Ulm University

  Co-Author: Ta-Kun Chen, Ph.D – Corporate Analytical Laboratories, Taiwan Semiconductor Manufacturing Company

  Co-Author: Vincent D.-H. Hou, Ph.D – Corporate Analytical Laboratories, Taiwan Semiconductor Manufacturing Company

  Co-Author: Glen Wilk, Ph.D – Advanced Semiconductor Materials (ASM) America

  Co-Author: Arkady Krasheninnikov, Ph.D – Helmholtz-Zentrum Dresden-Rossendorf

  Co-Author: Ute Kaiser, Ph.D – Ulm University

  Co-Author: David A. Muller (he/him/his) – Cornell University
• 9:00 AM - 9:15 AM MT

  Structural and Electronic Properties of 3C/4H-SiC Interface using Multislice Electron ptychography
  

  Presenting Author: Junghwa Kim, Ph.D (she/her/hers) – Massachusetts Institute of Technology

  Co-Author: Colin Gilgenbach – Massachusetts Institute of Technology

  Co-Author: Aaditya Bhat – Massachusetts Institute of Technology

  Co-Author: Katherine Harmon, Ph.D – Stanford University

  Co-Author: F. Joseph Heremans, Ph.D – Argonne National Laboratory

  Co-Author: Matthew J. Highland, Ph.D – Argonne National Laboratory

  Co-Author: Stephan O. Hruszkewycz, Ph.D – Argonne National Laboratory

  Co-Author: James LeBeau, Ph.D – Massachusetts Institute of Technology
• 9:15 AM - 9:30 AM MT

  Low-Dose Programmable Scanning Patterns for Correlative Ptychography and EELS in Ferroelectric Thin Films
  

  Presenting Author: Mariana Palos, Ph.D (she/her/hers) – Imperial College London

  Co-Author: Stephanie Ribet (she/her/hers) – Lawrence Berkeley National Laboratory

  Co-Author: Liam Spillane, Ph.D (he/him/his) – Gatan Inc.

  Co-Author: Yaqi Li – Imperial College London

  Co-Author: Umair Saeed – Catalan Institute of Nanoscience and Nanotechnology (ICN2)

  Co-Author: José Manuel Caicedo Roque – Catalan Institute of Nanoscience and Nanotechnology (ICN2)

  Co-Author: David Pesquera – Catalan Institute of Nanoscience and Nanotechnology (ICN2)

  Co-Author: Colin Ophus – Stanford University

  Co-Author: Shelly Michele Conroy – Imperial College London
• 9:30 AM - 9:45 AM MT

  Electron Ptychography Resolves Individual Atomic Layers in Twisted Super-Moiré
  

  Presenting Author: Chuqiao Shi – University of South California

  Co-Author: Yanxing Li – UT Austin

  Co-Author: Giovanny Espitia – UT Austin

  Co-Author: Rwik Dutta – UT Austin

  Co-Author: Yao Yang, Ph.D – Cornell University

  Co-Author: Yi Jiang – Argonne National Laboratory

  Co-Author: Mit Naik – UT Austin

  Co-Author: Chih-Kang Shih – UT Austin

  Co-Author: Yimo Han – Rice University
• 9:45 AM - 10:00 AM MT

  Cancelled - Ripples in 2D materials revealed by multislice electron ptychography with adaptive free path
  

  Presenting Author: Jizhe Cui, Ph.D – Tsinghua University School of Materials Science and Engineering

  Co-Author: Yi Zheng – Tsinghua University School of Materials Science and Engineering

  Co-Author: Kang Sun – Tsinghua University School of Materials Science and Engineering

  Co-Author: Haozhi Sha, Ph.D – Tsinghua University School of Materials Science and Engineering

  Co-Author: Wenfeng Yang (he/him/his) – Tsinghua University

  Co-Author: Rong Yu (he/him/his) – Tsinghua University