Analytical Sciences Symposia

3D Imaging of Defects, Buried Interfaces, and Strain with Multislice Electron Ptychography

Presenting Author(s)

• SK

  Shake Karapetyan

  Cornell University
  Cornell University
  Ithaca, NY, United States

Co-Author(s)

• SZ

  Steven E. Zeltmann

  Platform for the Accelerated Realization, Analysis, and Discovery of Interface Materials (PARADIM), United States
• PS

  Prosun Santra

  Helmholtz-Zentrum Dresden-Rossendorf, United States
• JB

  Johannes Biskupek, Ph.D

  Ulm University, United States
• TC

  Ta-Kun Chen, Ph.D

  Corporate Analytical Laboratories, Taiwan Semiconductor Manufacturing Company, United States
• VH

  Vincent D.-H. Hou, Ph.D

  Corporate Analytical Laboratories, Taiwan Semiconductor Manufacturing Company, United States
• GW

  Glen Wilk, Ph.D

  Advanced Semiconductor Materials (ASM) America, United States
• AK

  Arkady Krasheninnikov, Ph.D

  Helmholtz-Zentrum Dresden-Rossendorf, United States
• UK

  Ute Kaiser, Ph.D

  Ulm University, United States
• DM

  David A. Muller (he/him/his)

  Professor
  Cornell University
  (2) Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY USA
  Ithaca, New York, United States