Investigation of the Valence Band Edge of ONO Cells in Flash Memory Using Z-contrast Imaging

Tuesday, July 29, 2025

2:00 PM - 2:15 PM MT

Location: 251 C

All papers can be viewed in the published Meeting Proceedings on the MaM journal website.

Presenting Author(s)

Suhyun Kim

Technical leader
Analysis & Technology group / SK hynix, United States