A04.2 - Contributions of Analytical Electron Microscopy to Understanding Microstructural Evolution in Materials: James Bentley Memorial Symposium

Sponsored By 

Session Chair(s)

• PK

  Paul Kotula, Ph.D.

  Principal Member of Technical Staff
  Sandia National Laboratories
  Albuquerque, New Mexico, United States
• 

  Masashi Watanabe, Ph.D

  Professor
  Lehigh University
  Bethlehem, Pennsylvania, United States

Presentations:

• 1:30 PM - 2:00 PM MT

  The Evolution of Analytical Metrology for High Spatial Resolution and Sensitivity in the Analytical Transmission Electron Microscope
  

  Presenting Author: Nestor Zaluzec
• 2:00 PM - 2:30 PM MT

  The Evolution of Analytical Electron Microscopy Instrumentation and Techniques During the Career of Jim Bentley
  

  Presenting Author: J. K. Weiss, Ph.D – TESCAN Tempe
• 2:30 PM - 2:45 PM MT

  Advantages of an Electrostatic Beam Blanker in STEM
  

  Presenting Author: Ricardo Egoavil – Thermo Fisher Scientific, Eindhoven, Netherlands

  Co-Author: Pavel Potocek – Thermo Fisher Scientific, Eindhoven, Netherlands

  Co-Author: Eric Van Cappellen – Thermo Fisher Scientific

  Co-Author: Maria Meledina – Thermo Fisher Scientific

  Co-Author: Maarten Wirix – Thermo Fisher Scientific

  Co-Author: Bert Freitag – Thermo Fisher Scientific
• 2:45 PM - 3:00 PM MT

  A New Approach for Quantification of EELSpectra
  

  Presenting Author: Pavel Potapov (he/him/his) – IFW-Dresden

  Co-Author: Giulio Guzzinati, Ph.D – CEOS GmbH