P06.5 - Multimodal Data Acquisition and Analysis of Materials Under Real-World Conditions Using Advanced Electron Microscopy

Session Chair(s)

• 

  Jungwon Park

  Associate Professor
  Seoul National University
  Seoul National University, United States
• 

  Xiaobing Hu, Ph. D. (he/him/his)

  Research Associate Professor
  Department of Materials Science and Engineering
  Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208, United States
  The NUANCE Center, Northwestern University
  Evanston, IL, United States

Presentations:

• 1:30 PM - 1:45 PM MT

  Cancelled - Oops, I Contaminated It Again: Investigating Cross-Contamination in Liquid Cell TEM via Correlative Operando Electrochemistry and Cryogenic Atom Probe Tomography
  

  Presenting Author: Neil Mulcahy – Imperial College London

  Co-Author: Mary Ryan – Imperial College London

  Co-Author: Shelly Michele Conroy – Imperial College London
• 1:45 PM - 2:15 PM MT

  Fabrication Processes of Next-Gen Integrated Circuits through the Lens of In Situ Transmission Electron Microscopy
  

  Presenting Author: Utkur Mirsaidov – National University of Singapore
• 2:30 PM - 3:00 PM MT

  CANCELLED: Unraveling the Phase Evolution of Conductive Filaments in Transition Metal Sulphides by In Situ Biasing TEM
  

  Presenting Author: Shaobo Cheng (he/him/his) – Zhengzhou University

  Co-Author: Xing Li – Zhengzhou University

  Co-Author: Chongxin Shan – Zhengzhou University

  Co-Author: Yimei Zhu – Brookhaven National Laboratory