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Final Program


ViewAttendees 7

Analytical Sciences Symposia

A09.8 - In situ High-Resolution EBSD and Pattern Center Calibration

Combining in situ SEM and TEM Deformation with HREBSD Analysis to Understand Dislocation/Grain Boundary Interactions – From Unit Processes to Resolved Stress Fields

Thursday, July 31, 2025
1:30 PM - 2:00 PM MT
Location: 150 DEF

All papers can be viewed in the published Meeting Proceedings on the MaM journal website.

    Presenting Author(s)

  • JK

    Josh Kacher

    Associate Professor
    Georgia Institute of Technology
    Georgia Institute of Technology
    Atlanta, GA, United States

    • Co-Author(s)

  • YS

    Yang Su

    Georgia Institute of Technology, United States