Analytical Sciences Symposia

Quantifying the surface sensitivity of atomic resolution secondary electron imaging

Presenting Author(s)

• JM

  Joel Martis, PhD

  Bruker AXS LLC, WA, United States

Co-Author(s)

• BP

  Benjamin Plotkin-Swing

  Bruker AXS LLC, United States
• MH

  Michael T. Hotz

  Bruker AXS LLC, United States
• ND

  Niklas Dellby

  Bruker AXS LLC, United States
• CS

  Cong Su, PhD

  Yale University, United States
• OK

  Ondrej L. Krivanek

  Bruker AXS LLC
  Kirkland, Washington, United States
• TL

  Tracy Lovejoy

  Bruker AXS LLC, United States