Analytical Sciences Symposia

Experimental Analysis of Detector Noise in Scanning Electron Microscopy

Presenting Author(s)

• 

  Surya Kamal, Ph.D (he/him/his)

  Research Scientist
  Rochester Institute of Technology
  Rochester Institute of Technology, United States

Co-Author(s)

• KN

  Kevin Mogere Nyaburi (he/him/his)

  Rochester Institute of Technology, United States
• RH

  Richard Hailstone

  Rochester Institute of Technology, United States