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Physical Sciences Symposia

P06.5 - Multimodal Data Acquisition and Analysis of Materials Under Real-World Conditions Using Advanced Electron Microscopy

Fabrication Processes of Next-Gen Integrated Circuits through the Lens of In Situ Transmission Electron Microscopy

Thursday, July 31, 2025

1:45 PM - 2:15 PM MT

Location: 250 D

All papers can be viewed in the published Meeting Proceedings on the MaM journal website.

Presenting Author(s)