Bruker | Latest Developments with Nion Microscopes
Wednesday, July 30, 2025
5:45 PM - 6:45 PM MT
Location: Exhibit Hall BCDE
Booth 1424
The Nion microscope series by Bruker has demonstrated 2.6 meV energy resolution, atomic-resolution secondary electron imaging in a clean UHV environment, and now atomic-resolution STEM and spectroscopy with the sample at 9 Kelvin. This tutorial will describe these developments and show recent applications including a live demonstration of the instrument.