TESCAN | Plasma FIB-SEM Redefined: AMBER X 2 for Automated Sample Prep and 3D Characterization with Mistral pFIB

Booth 1324

Experience the power of Mistral plasma FIB in AMBER X 2 – enabling fast, precise large-area milling. Automate TEM sample prep and 3D microanalysis with unmatched throughput and precision. Ideal for labs needing versatility, sample preparation and analytical repeatability across complex samples.
Target Audience: Materials scientists, 3D/volume EM users, Plasma FIB and TEM prep experts