NenoVision | LiteScope AFM-in-SEM for Correlated Electrical, Magnetic, and Mechanical Sample Analysis

Booth 2136

This tutorial introduces the AFM-in-SEM LiteScope with patented CPEM technology for seamless integration into Scanning Electron Microscopes. Combining AFM and SEM enables efficient workflows and comprehensive analysis of sample topography, mechanical, electrical, magnetic, and piezoelectric properties. Applicable across materials science, semiconductors, life sciences, and earth sciences, we’ll cover how the technology works and discuss its research applications.