Nanoscience Instruments Inc. | 100x Faster Imaging for Electron Microscopy
Monday, July 28, 2025
5:45 PM - 6:45 PM MT
Location: Exhibit Hall BCDE
Booth
Introducing ‘compressed sensing’ software from SenseAI, for superfast sampling of a fraction of your image data without loss of any inherent information. SenseAI generates images up to 100x faster, resulting in significantly reduced beam damage, and most importantly, without loss of image integrity. We'll discuss the limitations in current imaging techniques, from beam damage to slowness, complexity and poor results, and we'll introduce the SenseAI software with a live demo.