Bruker | Nanoscale Chemical Identification and Mapping with AFM-IR

Booth 1424

SEM/EDX is an industry standard technique for surface characterization using x-rays generated in-situ within an electron microscope and provides elemental information on the nanoscale. While powerful, EDX has key limitations discriminating lighter elements as well as carbon deposition induced by the electron beam. AFM-IR (Atomic Force Microscopy-Infrared) is a complementary technique which can provide non-destructive <10 nm lateral resolution chemical identification in ambient conditions. AFM-IR correlates strongly with traditional FTIR spectroscopy which allows FTIR chemical libraries to be used to identify compounds measured with AFM-IR. This presentation introduces AFM-IR, discusses the benefits of the technique and its core strengths in identification of lighter elements, especially carbon containing species and highlights core applications of this novel technique.