Skip to main content
M&M 2025 (Microscopy & Microanalysis) Main banner
Final Program


ViewAttendees 5

X41 | Physical Sciences Tutorial | Ex Situ and In Situ TEM characterization of extended defects

Wednesday, July 30, 2025
10:30 AM - 12:00 PM MT
Location: 254 A
Topics Include:

  • Basics of dislocation loops and voids analysis

  • Effects of FIB induced damage and ways to mitigate it

  • In-situ TEM characterization of extended defects dynamics

    Presenting Author(s)

  • Kaustubh Bawane

    Staff Scientist
    Idaho National Laboratory
    Idaho Falls, ID, United States