Oxford Instruments | Bring WDS capability to your SEM using the latest EDS technology
Tuesday, July 29, 2025
5:45 PM - 6:45 PM MT
Location: Exhibit Hall BCDE
Booth 1534
Applications once reliant on SEM-WDS are now increasingly rare and be handled by EDS, offering equivalent results with faster, more familiar workflows. Thanks to the speed, versatility, and ease-of-use of Oxford Instruments’ Ultim Max Infinity EDS detector and Unity BEX (backscattered electron and X-ray imaging) detector—EDS is more powerful than ever. This tutorial will feature direct EDS vs. WDS comparisons and practical guidance on transitioning your WDS applications to EDS. Learn how to apply EDS for applications traditionally dominated by WDS, including the analysis of: - Peak overlaps - Light element analysis - Minor and trace element constituents -Quantitative analysis.