CIQTEK | Unlocking the Power of High-Speed Scanning Electron Microscopy without compromising resolution at low kV
Wednesday, July 30, 2025
5:45 PM - 6:45 PM MT
Location: Exhibit Hall BCDE
Booth 1303
In this session, we’ll explore what makes CIQTEK’s high-speed Field Emission SEM (FESEM) truly different — from its unique multi-technology integration to the real-world applications where it delivers the greatest impact. Learn how this advanced, bundled system opens up true imaging bandwidth, significantly boosting throughput while still maintaining exceptional resolution, even at low accelerating voltages.