RAITH America | RAITH IONMASTER: High-Resolution 3D Ion Imaging and SIMS Nano-Analytics for Advanced Materials Characterization
Tuesday, July 29, 2025
5:45 PM - 6:45 PM MT
Location: Exhibit Hall BCDE
Booth 1433
Cutting-edge materials research increasingly demands high-resolution analytical techniques for nanoscale structural and compositional analysis. The RAITH IONMASTER is an advanced platform for high-resolution 3D ion imaging and SIMS nano-analytics, combining a Liquid Metal Alloy Ion Source (LMAIS), laser interferometer stage, and magnetic sector SIMS unit. It achieves sub-2 nm imaging resolution and SIMS analytical resolution better than 20 nm when using Li⁺ as the primary ion species. Ideal for semiconductors, thin films, and nanostructured materials, it enables precise elemental mapping and microstructural analysis. Enhanced by CAD-based navigation and automated workflows, it ensures reproducibility and throughput, advancing nanoscale materials research and technological development.