A03.3 - When 4D-STEM Meets More Dimensions: Deepening Materials Insights with Efficient Experimental Design and Smart Computational Microscopy

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Presentations:

• 1:30 PM - 2:00 PM MT

  Probing Strain, Stacking, and Switching of van der Walls Materials using 4D-STEM
  

  Presenting Author: Yimo Han – Rice University

  Co-Author: Chuqiao Shi – University of South California

  Co-Author: Xinyan Li – Rice University

  Co-Author: Nannan Mao – MIT

  Co-Author: Yi Jiang – Argonne National Laboratory

  Co-Author: Jing Kong – MIT
• 2:00 PM - 2:15 PM MT

  Measuring strain in moirés from overlapping dark field reflections in 4D-STEM
  

  Presenting Author: Isaac Craig – University of California, Berkeley

  Co-Author: Madeline Van Winkle, PhD – National Renewable Energy Laboratory

  Co-Author: Colin Ophus – Stanford University

  Co-Author: D. Kwabena Bediako – University of California Berkeley
• 2:15 PM - 2:30 PM MT

  Characterization of Mirror Twin Boundaries in Monolayer MoS2 via Atomic Resolution STEM and 4D-STEM
  

  Presenting Author: Qingxiao Wang – Imaging & Characterization Core Labs, KAUST, Saudi Arabia

  Co-Author: Jie Shen – Nanyang Technological University

  Co-Author: Yu Han (he/him/his) – South China University of Technology
• 2:30 PM - 3:00 PM MT

  Retrieving 3D Atomic Coordinates of 2D Materials using Multislice Electron Ptychography
  

  Presenting Author: Jeffrey Huang (he/him/his) – University of Illinois Urbana-Champaign

  Co-Author: Yichao Zhang – University of Maryland

  Co-Author: Sang hyun Bae – University of Illinois Urbana-Champaign

  Co-Author: Ballal Ahammed – University of Illinois Urbana-Champaign

  Co-Author: Elif Ertekin – University of Illinois Urbana-Champaign

  Co-Author: Pinshane Y. Huang, Ph.D – University of Illinois at Urbana Champaign