A06.4 - Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens

Presentations:

• 1:30 PM - 2:00 PM MT

  From Electrical Characterization to Surface Contamination: The Role of Electrical-based Scanning Probe Microscopy Techniques
  

  Presenting Author: Corey Carlos, Ph.D. – Sandia National Laboratories
• 2:00 PM - 2:15 PM MT

  Multi-Modal Approach for Quality Control and Failure Analysis of Metal Lines for Chiplets Integration
  

  Presenting Author: Kerim Tugrul Arat, PhD (he/him/his) – Quantum Design Inc.

  Co-Author: Darshit Jangid – Quantum Design Microscopy GmbH

  Co-Author: Hajo Frerichs, Ph.D. – Quantum Design Microscopy GmbH

  Co-Author: William Neils, Ph.D. – Quantum Design Inc.

  Co-Author: stefano spagna, Ph.D. – Quantum Design Inc.
• 2:15 PM - 2:45 PM MT

  Improving Precision and Time to Knowledge in Atom Probe Tomography Data Analysis
  

  Presenting Author: Robert M. Ulfig, MS – CAMECA Instruments Inc.

  Co-Author: David A. Reinhard – CAMECA Instruments Inc.

  Co-Author: Paul M. Voyles – University of Wisconsin-Madison

  Co-Author: Jingrui Wei – University of Wisconsin-Madison

  Co-Author: Mike Keenan, Ph.D – Private Consultation

  Co-Author: David Larson – CAMECA Instruments Inc.