Nitin Varshney

University of Florida

Poster(s):

• (436) A Next-Generation Defect Taxonomy for AI-Enhanced SEM-Based Semiconductor Inspection
  Thursday, July 31, 2025

  10:00 AM - 12:00 PM MT

• (379) Proposed Automated Sample Preparation and SEM Imaging Workflow for Semiconductor Wafers
  Thursday, July 31, 2025

  10:00 AM - 12:00 PM MT

• (382) ZEAL – A Framework for Zero-Shot Enhanced Analysis and Learning for SEM Image Defect Correction in ICs
  Thursday, July 31, 2025

  10:00 AM - 12:00 PM MT