Applications Engineer
Delong America
McGill University, Canada
Emad Shahnam is a researcher in electron microscopy and materials science. His work focuses on the imaging and analysis of nanomaterials, biological specimens, and soft matter using techniques such as TEM, SEM, STEM, and EDS. He holds a Master’s degree in Mechanical Engineering from the University of Waterloo and is currently pursuing a PhD in Materials Engineering at McGill University, where his research explores low-voltage transmission electron microscopy for EDS applications. In parallel, as an Applications Engineer at Delong America, Emad supports research teams in academia and industry through training, technical assistance, and the collaborative development of microscopy workflows. He also contributes to conference presentations, publications, and workshops aimed at advancing the use of low voltage electron microscopy in interdisciplinary research.