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Final Program


Mingjian Wu (he/him/his)

Friedrich-Alexander-Universität Erlangen-Nürnberg
Friedrich-Alexander-Universität Erlangen-Nürnberg
Erlangen, Bayern, Germany

I am an enthusiastic “nano-photographer” with over 15 years of experience in electron microscopy. My expertise lies in developing and applying advanced microscopy, diffraction, and spectroscopy techniques—integrated with in situ, operando, and data science approaches—to gain unique insights into modern functional materials. I earned my Bachelor’s and Master’s degrees in Materials Science from Hunan University, China, before moving to Germany for doctoral research. I investigated structural phase stability in III-V semiconductors with Dr. Achim Trampert at the Paul-Drude-Institut in Berlin. I obtained my Dr. rer. nat. from Humboldt-Universität zu Berlin in 2014 with the highest distinction (summa cum laude). Following a short research stay in Finland, I joined the Institute of Micro- and Nanostructure Research (IMN) at FAU in 2015.

Currently, I am a staff scientist at IMN, where I:

Advise on various research projects, providing expertise in advanced electron microscopy and spectroscopy.
Supervise the institute’s double Cs-corrected, monochromated Titan Themis and co-supervise the probe-corrected Spectra 200 TEMs.

My research focuses on:

Methodologies: Diffraction-based techniques (4D-STEM), detector technologies, high-resolution imaging and spectroscopy, phase contrast methods, and in situ microscopy.
Materials: Extended defects in semiconductors, metals, and thin films; nano-alloys and intermetallics; organic/inorganic materials for photovoltaics and optoelectronics.

Disclosure information not submitted.

Presentation(s):