AtomQ, United States
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Small data Is All You Need – Machine Learning-based Feature Identification in Scanning Transmission Electron Microscopy (STEM) Images of MoS2
Wednesday, July 30, 20259:00 AM - 9:15 AM MT
In-situ Monitoring of Automated Defect Formation in STEM
Thursday, July 31, 20259:00 AM - 9:15 AM MT