Zijie Wu, Ph.D

Oak Ridge National Laboratory, United States

Disclosure information not submitted.

Presentation(s):

• In-situ Monitoring of Automated Defect Formation in STEM

  Thursday, July 31, 2025
  9:00 AM - 9:15 AM MT

• Cancelled - Automated and autonomous scanning transmission electron microscopy: transformers and generative machine learning for image optimization and segmentation

  Thursday, July 31, 2025
  3:30 PM - 4:00 PM MT