Materials Data Scientist
DataSophos LLC
Boulder, Colorado, United States
Joshua Taillon is a Materials Research Engineer at NIST within the Office of Data and Informatics. Drawing on an extensive background in materials characterization, his professional interests lie at the intersection of microanalysis and data science, utilizing machine learning, AI, and state-of-the art signal/data processing techniques to better understand material systems. He received his B.S. in Materials Science and Engineering from Cornell University in 2011, followed by his Ph.D. from the University of Maryland, College Park in 2016, where his thesis involved using a myriad of microanalysis and microscopy techniques (EELS, EDS, EBSD, SIMS, etc. on TEM, SEM, and FIB platforms) to characterize microelectronic and alternative energy systems. He joined NIST as a postdoc in the Microscopy and Microanalysis Research Group, where he investigated the potential of compressed sensing strategies for accelerating EDS analysis. He believes strongly in the mission of educating the current and next generations of microanalysts in data science, analysis, and management, and has presented over 10 software tutorials to various audiences, including regular invitations to other institutions. He advocates for the use of open-source tools and analysis frameworks to democratize data analysis and promote reproducible science through open data access.
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X10 - EM Data Analysis with the HyperSpy Ecosystem
Sunday, July 27, 2025
8:30 AM - 5:00 PM MT