M. Grace Burke, PhD
Laboratory Fellow
Idaho National Laboratory
University of Manchester
Pittsburgh, PA, United States
Presenting Author: Hamish L. Fraser, PhD – Ohio State University
Presenting Author: Wei-Chang (David) Yang, PhD – Materials Science and Engineering Division, National Institute of Standards and Technology, Gaithersburg, MD, United States
Co-Author: Min-Yeong Kim – Nanoscale Device and Characterization Division, National Institute of Standards and Technology, Gaithersburg, MD, United States
Co-Author: Andrew Winchester – Nanoscale Device and Characterization Division, National Institute of Standards and Technology, Gaithersburg, MD, United States
Co-Author: Alline Myers – Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD, United States
Co-Author: Sang-Mo Koo – Department of Electrical Material Engineering, Kwangwoon University, Seoul, Republic of Korea
Co-Author: Qiliang Li – Department of Electrical Engineering, George Mason University, Fairfax, VA, United States
Co-Author: Sujitra Pookpanratana – Nanoscale Device and Characterization Division, National Institute of Standards and Technology, Gaithersburg, MD, United States
Presenting Author: William Hubbard, PhD – NanoElectronic Imaging Inc.
Co-Author: B. C. C. Regan – UCLA
Presenting Author: Neal D. Evans, Ph.D. – University of Tennessee, Knoxville
Co-Author: Edward A. Kenik, Ph.D. – Oak Ridge National Laboratory (retired)