A09.8 - In situ High-Resolution EBSD and Pattern Center Calibration

Sponsored By 

Session Chair(s)

• TR

  Timothy Ruggles, Ph. D

  Sandia National Laboratory
  Albuqueruqe, United States

Presentations:

• 1:30 PM - 2:00 PM MT

  Combining in situ SEM and TEM Deformation with HREBSD Analysis to Understand Dislocation/Grain Boundary Interactions – From Unit Processes to Resolved Stress Fields
  

  Presenting Author: Josh Kacher – Georgia Institute of Technology

  Co-Author: Yang Su – Georgia Institute of Technology
• 2:00 PM - 2:15 PM MT

  Pattern Centre Accuracy and HREBSD: Towards Absolute Strain
  

  Presenting Author: Graham Meaden (he/him/his) – BLG Vantage

  Co-Author: Austin Day – Aunt Daisy Scientific Ltd

  Co-Author: David Dingley – BLG Vantage

  Co-Author: Damian J. Dingley – BLG Vantage

  Co-Author: Seiichi Suzuki, Ph.D – TSL Solutions Ltd.
• 2:15 PM - 2:30 PM MT

  Cancelled - EBSD Pattern Center Fitting with Particle Swarm Optimization
  

  Presenting Author: David Rowenhorst, Ph.D – US Naval Research Laboratory

  Co-Author: William C. Lenthe, Ph.D – Gatan
• 2:30 PM - 2:45 PM MT

  Concurrent In-Situ High-Resolution Electron Backscatter Diffraction and Digital Image Correlation for Full-Field Stress-Strain
  

  Presenting Author: Will G. Gilliland (he/him/his) – Sandia National Laboratories

  Co-Author: Tim Ruggles, Ph. D – Sandia National Laboratory

  Co-Author: Kaitlynn Fitzgerald – United States Naval Academy

  Co-Author: Jay Carroll – San

  Co-Author: Geoffrey Bomarito – NASA

  Co-Author: Jacob Hochhalter – University of Utah
• 2:45 PM - 3:00 PM MT

  Cancelled - Using Emerging EBSD and TKD Tools for Phase Detection in Martensitic Steels
  

  Presenting Author: Patrick Callahan, Ph.D – US Naval Research Laboratory

  Co-Author: David Rowenhorst, Ph.D – US Naval Research Laboratory