Skip to main content
M&M 2025 (Microscopy & Microanalysis) Main banner
Final Program


Analytical Sciences Symposia

Category: Featured Syposium

A08.P1 - Next Generation Microanalysis Standards For EPMA and SEM-EDS Calibration

(387) Secondary Boundary Fluorescence Corrections in Electron Probe Microanalysis

Thursday, July 31, 2025
10:00 AM - 12:00 PM MT

    Presenting Author(s)

  • John Donovan

    President
    Probe Software
    University of Oregon
    Eugene, OR, United States

    • Co-Author(s)

  • AM

    Aurélien Moy

    Assistant Scientist
    Gatan, United States