Physical Sciences Symposia

Advancing High-Resolution Electron Microscopy and Spectroscopy through Integrating the CEOS Energy-Filtering and Imaging Device into the Monochromated JEOL Atomic-Resolution Multi-Dimensional TEM at the Max Planck Institute for Solid State Research

Presenting Author(s)

• 

  Peter A. van Aken

  Head of StEM
  Max Planck Institute for Solid State Research
  Max Planck Institute for Solid State Research
  Stuttgart, Baden-Wurttemberg, Germany

Co-Author(s)

• TH

  Tobias Heil

  Max Planck Institute for Solid State Research, United States
• HM

  Heiko Müller, Ph.D

  CEOS GmbH
  Heidelberg, Baden-Wurttemberg, United States
• 

  Stephan Uhlemann, Ph.D

  CEOS GmbH, Baden-Wurttemberg, United States
• KE

  Kenan Elibol

  Scientist
  Max Planck Institute for Solid State Research
  (2) Faculty of Physics, University of Vienna, Vienna, Austria, (3) Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN) and Advanced Materials and Bio-Engineering Research Centre (AMBER), School of Chemistry, Trinity College Dublin, The University of Dublin, Dublin, Ireland
  Stuttgart, Baden-Wurttemberg, United States
• PK

  Pirmin Kükelhan, Ph.D

  CEOS GmbH, United States
• ML

  Martin Linck, Ph.D

  R&D Scientist
  CEOS GmbH
  Heidelberg, Baden-Wurttemberg, United States
• HW

  Hongguang Wang

  Max Planck Institute for Solid State Research, United States
• AN

  Akiho Nakamura

  JEOL Ltd., United States
• MM

  Masaki Mukai

  Research and Development Engineer
  JEOL Ltd.
  Akishima, United States